Deposition and Characterization of High-k and Low-k Thin
Films for Si Semiconductor Devices, Fabrication and
Characterization of SiC W-de-Band Semiconductor Devices,
MgO Protective Layer for AC-PDP, Deposition and
Characterization of MgO Thin Films Deposited by ESD
(Hydration of MgO Thin Films), SAW Filters for
Telecommunication Devices, Fabrication of FBAR